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Module Detailed Information for [EE4434]
Academic Year : 2017/2018 Semester : 2
Correct as at 30 Mar 2018 04:27

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Module Information
Module Code :
Module Title : Integrated Circuit Technology, Design and Testing
Module Description : This module aims to introduce students to the industry practice on the technology, design, layout and testing of digital and memory integrated circuits (IC). Students will be introduced to the different types of devices which are manufactured in a foundry. Students will learn about the ideas of design for testability through lectures, hands on exposure to different testing and debugging tools and industrial visits. Specific topics include wafer technology and devices, digital logic and memory design and layout, fundamentals of digital and static random access memory (SRAM) testing, design for testability, fault isolation and electrical characterization.
Module Examinable : -
Exam Date : 02-05-2018 PM
Modular Credits : 4
Pre-requisite : EE2020 Digital Fundamentals EE2021 Devices and Circuits
Preclusion : Nil
Module Workload (A-B-C-D-E)* : 3-0.5-0.5-0.5-5.5
Remarks : Nil
* A: no. of lecture hours per week
B: no. of tutorial hours per week
C: no. of laboratory hours per week
D: no. of hours for projects, assignments, fieldwork etc per week
E: no. of hours for preparatory work by a student per week

Lecture Time Table
Class TypeWeek TypeWeek DayStartEndRoom

Tutorial Time Table
Attention: The tutorial timetables could be updated from time to time. Students are advised to check regularly for the latest update on the change of tutorial timing.
No Tutorial Class or to be announced. Please check with the department offering this module.

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